Interface structure and surface morphology of (Co, Fe, Ni)/Cu/Si(100) thin films

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Interface structure and surface morphology of (Co, Fe, Ni)/Cu/Si(100) thin films

We have examined bilayer Co/Cu, Fe/Cu, and Ni/Cu films deposited by molecular-beam epitaxy on hydrogen-terminated @100# silicon substrates. The magnetic metal/copper interface was examined by atomic resolution transmission electron microscopy and compared with the surface morphology as depicted by atomic force microscopy. The general orientation relationships across the magnetic metal/copper in...

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ژورنال

عنوان ژورنال: Journal of Applied Physics

سال: 1996

ISSN: 0021-8979,1089-7550

DOI: 10.1063/1.363548